概述
Features:
- Standard cross roller guide rail ensures the straightness and parallelism accuracy of the probe holder;
- Adopting a high-strength magnetic base for easy adjustment of the installation position of the probe holder;
- Using differential head drive combined with microscope observation adjustment, it has a high-resolution adjustment effect.
The probe holder is an accessory used in conjunction with the probe station to adjust the movement of the probe, achieving linear and three-dimensional adjustment. The movement stroke of the X-Y-Z axis varies among different models. Install the probe arm and probe onto the manual probe holder, and use a microscope to adjust the probe tip to the correct position on the test object; Suitable for RF, DC, optical and other chip testing, compatible with Cascade/FFI DPP/RPP series probe sockets.
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