概述
Tunable light sources are essential instruments for wavelength-related testing of passive and active devices in the optical communication field. They can accurately and quickly adjust to appropriate wavelengths to meet testing requirements. When paired with a power meter with a high sampling rate, they can efficiently collect the power-wavelength curves of devices and test the performance parameters of devices at different wavelengths.
The TopLight tunable light source is the first tunable light source developed by Dimension Labs, integrating 16 years of professional experience in the optical testing field. It features high wavelength accuracy, fast scanning speed, high output power stability, and mode-hop-free operation across the entire wavelength band. With high integration, a compact size, and flexible operation, this product can meet all testing requirements of wavelength division multiplexing (WDM) devices when combined with Dimension Labs' high-speed power meters and polarization controllers.
Key Advantages
●Wavelength accuracy: ±20 pm
●Scanning speed: 100 nm/s
●High signal-to-noise ratio and side-mode suppression ratio
●Mode-hop-free across the entire wavelength band
●Optional C+L band or O band
Main Applications
●WDM Scanning Test
●Optical Passive System Test
●Wavelength Dependence Test
●Specific Wavelength Output
●Spectroscopy
Ultra-high wavelength accuracy, repeatability, and stability with consistent output power
The TopLight Tunable Laser Source achieves a wavelength accuracy of ±20 pm through precision electromechanical control. Even during high-speed scanning, it maintains reliable wavelength repeatability and stability. In varying test environments, TopLight dynamically compensates for environmental changes to ensure consistent wavelength precision.
The output power of the light source is rigorously fitted to the wavelength dependence to ensure a power curve flatness of better than 0.2 dB/nm, minimizing power-induced errors in the test system.
High output spectral signal-to-noise ratio (SNR) and side-mode suppression ratio (SMSR)
The TopLight leverages the external cavity resonance principle for wavelength tuning. Through its precision optical and electromechanical control systems, it ensures the narrow-linewidth laser output from the resonant cavity consistently maintains excellent SNR and SMSR. This provides an ideal testing environment for rigorous wavelength scanning systems.
Mode-hop-free operation across the entire wavelength band, ensuring continuous wavelength tuning
Dimension Labs' expertise in opto-mechatronic integration provides robust support for mode control in tunable light sources. Through precision control and advanced algorithms, TopLight ensures dominant output of the primary mode wavelength while maintaining ultra-high scanning speeds and wavelength accuracy. This allows seamless testing without the need for wavelength calibration components during scans.
Paired with a wavelength scanning system to enable scanning tests of optical devices
Dimension Labs' self-developed wavelength scanning system, equipped with the TopLight tunable light source and high-speed power meter, achieves a wavelength accuracy of ±5 pm and a fast scanning speed of 100 nm/s, providing an efficient and precise testing solution for wavelength-dependent devices.
Leveraging years of design experience, Dimension Labs has developed system software with excellent human-computer interaction, allowing users to complete wavelength scanning tests clearly and simply. Users only need to click the test button to obtain detailed test reports.
Moreover, due to the platform + modular design architecture, Dimension Labs' equipment offers extremely high flexibility when requirements change. It can be upgraded to a new testing environment simply by adding, removing, or replacing modules, saving users a great deal of time and economic costs.
Multiple selectable wavelength ranges, covering various device application scenarios
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Performance Parameters
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Category |
Parameter |
TLS Tunable Light Source |
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Wavelength Characteristics |
Tunable Wavelength Range | 1260nm~1360nm/1525nm-1630nm | ||
| Wavelength Resolution | 0.1pm | |||
| Wavelength Stability | ±5pm | |||
| Wavelength Accuracy | Absolute Accuracy | ±20pm | ||
| Absolute Accuracy | Step Scanning | ±10pm | ||
| Repeatability | ±5pm | |||
| Absolute Accuracy | Continuous Scanning@100nm/s | ±20pm | ||
| Repeatability | ±10pm | |||
| Maximum Scanning Speed | 200nm/s | |||
| Output Power Characteristics |
Output Power |
Peak Value | +13dBm | |
| >10dBm Range | 1260nm-1360nm/1525nm-1630nm | |||
| Full Wavelength Tuning Range | +13~-15dBm | |||
| Stability | ±0.01dB | |||
| Repeatability | Step Scanning | ±0.01dB | ||
| Flatness | ±0.2dB | |||
| Repeatability | Continuous Scanning@100nm/s | ±0.01dB | ||
| Flatness | ±0.2dB | |||
| Relative Intensity Noise (RIN) (Typical Value) | 145dB/Hz(1MHz to 3 GHz) | |||
| Spectral Characteristics | Linewidth | 200KHz | ||
| SMSR | 60dB | |||
| SINR | 70dB | |||
Ordering Information
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